Standard: ECIA - EIA CB 13

X-RAY FLUORESCENCE FOR MEASURING PLATING THICKNESS

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Scope:

PURPOSE

There are a number of techniques currently being used for measuring plating thickness. All have peculiar application and also limitations, Basic economics, however, demands that for measuring gold thicknesses in the commonly used plating thickness ranges, a system must be highly reliable, accurate, repeatable and fast. Over the past several years X-ray Fiuorescence systems, more than any other, have been found to meet that requirement. There are, however, many facets of operation involved with x-ray techniques with which the operator should be acquainted. The purpose of this paper is to highlight these subtleties so that x-ray users are aware of them and can implement procedures for their instrument operation which will provide measurements of highest possible levels of accuracy and repeatability.

Organization: Electronic Components Industry Association
Document Number: eia cb 13
Publish Date: 1990-01-01
Page Count: 8
Available Languages: EN
DOD Adopted: NO
ANSI Approved: NO
Most Recent Revision: YES
Current Version: YES
Status: Active

This Standard References

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