Standard: IEEE 1160
STANDARD TEST PROCEDURES FOR HIGH-PURITY GERMANIUM CRYSTALS FOR RADIATION DETECTORS
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This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3 , usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-1984.
|Organization:||The Institute of Electrical and Electronics Engineers, Inc.|
|Document Number:||ieee 1160|
|Most Recent Revision:||YES|
|Document #||Change Type||Update Date||Revision||Status|
|IEEE 1160||Change Type: REAF||Update Date: 1993-01-01||Revision: 93||Status: ACTV|
Standards That Reference This Standard
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