Standard: ECIA - EIA CB 5-1

RECOMMENDED TEST PROCEDURE FOR SEMICONDUCTOR THERMAL DISSIPATING DEVICES

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Scope:

The scope of this supplement to EIA Components Bulletin No. 5 is to present methods of instrumentation for plastic case semiconductors and integrated circuits for evaluation of thermal dissipating devices.

Organization: Electronic Components Industry Association
Document Number: eia cb 5-1
Publish Date: 1971-05-01
Page Count: 14
Available Languages: EN
DOD Adopted: NO
ANSI Approved: NO
Most Recent Revision: YES
Current Version: YES
Status: Active
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