Standard: IEEE 1140
STANDARD PROCEDURES FOR THE MEASUREMENT OF ELECTRIC AND MAGNETIC FIELDS FROM VIDEO DISPLAY TERMINALS (VDTS) FROM 5 HZ TO 400 KHZ
This standard is available for individual purchase.
IHS Standards Expert subscription, simplifies and expedites the process for finding and managing standards by giving you access to standards from over 370 standards developing organizations (SDOs).FEATURES & BENEFITS
- Maximize product development and R&D with direct access to over 1.6 million standards
- Discover new markets: Identify unmet needs and discover next-generation technologies
- Improve quality by leveraging consistent standards to meet customer and market requirements
- Minimize risk: Mitigate liability and better understand compliance regulations
- Boost efficiency: Speed up research, capture and reuse expertise
HOW TO SUBSCRIBE
This standard provides procedures for the measurement of electric and magnetic fields in close proximity to video display terminals (VDTs) in the frequency range of 5 Hz to 400 kHz. This standard adapts existing international measurement technologies [B7]1 and practices to achieve a consistent and harmonious VDT measurement standard for testing in a laboratory controlled environment. Such measurements are needed for investigative studies that rely on the knowledge of electric and magnetic field levels near electronic equipment.
The requirements of the controlled laboratory test environment in which the characteristics specified in this standard are to be tested are difficult to establish at a user's installation. Therefore, it is recognized that the results obtained in the laboratory may be difficult to reproduce in the on-site environment.
This standard does not provide measurements at specific frequencies, but does provide one measurement for each of two frequency bands: 5 Hz to 2 kHz and 2 kHz to 400 kHz.
1The numbers in brackets preceded by the letter B correspond to those of the bibliography in clause 8.
|Organization:||The Institute of Electrical and Electronics Engineers, Inc.|
|Document Number:||ieee 1140|
|Most Recent Revision:||YES|
|Document #||Change Type||Update Date||Revision||Status|
|IEEE 1140||Change Type: REAF||Update Date: 1994-01-01||Revision: 94||Status: INAC|