Standard: IEEE 113
GUIDE: TEST PROCEDURES FOR DIRECT-CURRENT MACHINES
This standard is available for individual purchase.
IHS Standards Expert subscription, simplifies and expedites the process for finding and managing standards by giving you access to standards from over 370 standards developing organizations (SDOs).FEATURES & BENEFITS
- Maximize product development and R&D with direct access to over 1.6 million standards
- Discover new markets: Identify unmet needs and discover next-generation technologies
- Improve quality by leveraging consistent standards to meet customer and market requirements
- Minimize risk: Mitigate liability and better understand compliance regulations
- Boost efficiency: Speed up research, capture and reuse expertise
HOW TO SUBSCRIBE
These test procedures include recommendations for conducting and reporting generally acceptable tests to determine the performance characteristics of conventional direct-current machines. The tests are in two categories as described in 1.1 and 1.2.
Tests of Direct-Current Motors and Generators Designed for Essentially Ripple-Free Operation. For operation to be classed as ripplefree in accordance with this test procedure, the peak-to-peak value of the alternating component of the current shall be less than 6%, or the rms value less than 2%) of the rated current of the test machine at any of the test conditions provided that the lowest alternating frequency component of the current is 50 Hz or greater.
Tests of Direct-Current Motors Designed for Use with Rectifier Power Supplies. When a test procedure applies to a dc motor supplied with rectified power not meeting the essentially ripple-free criteria of 1.1, the procedure will be identified by the following opening statement: "On rectified power .
A brief bibliography of technical papers relating to the operation of dc motors on rectified power is located in Section 8.
Other Test Procedures. It is recognized that there may be test procedures other than those described herein. When more than one procedure can be used, local conditions and the degree of precision desired will determine the procedure to be used. This guide shali not be interpreted or construed as requiring the performance of any or all of the tests herein, in any given transaction.
|Organization:||The Institute of Electrical and Electronics Engineers, Inc.|
|Document Number:||ieee 113|
|Most Recent Revision:||YES|
|Document #||Change Type||Update Date||Revision||Status|
|IEEE 113||Change Type:||Revision: 73||Status: INAC|
|IEEE 113||Change Type:||Revision: 62||Status: INAC|
This Standard References
Showing 10 of 10.