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Semiconductor devices can be permanently damaged by reactor spectrum neutrons (1, 2) . The effect of such damage on the performance of an electronic component can be determined by measuring the component's electrical characteristics before and after exposure to fast neutrons in the...
Semiconductor devices are permanently damaged by reactor spectrum neutrons. The effect of such damage on the performance of an electronic component can be determined by measuring the component electrical characteristics before and after exposure to fast neutrons in the neutron fluence...
1.1 As the General Accountability Office (GAO) reported in 2018 (2), the discovery of toxic levels of lead in drinking water in Flint, Michigan in 2015 renewed awareness about the risks that lead poses to public health. Exposure to lead can result in elevated blood lead levels and...
This part of IEC 60300 serves as an application guide to a reliability stress screening process for electronic hardware. The concept, purpose and justification of the screening process are explained. The main elements of a screening programme are stated, together with the...
This test method2 covers determination of the absorption coefficient due to the interstitial oxygen content of commercial monocrystalline silicon wafers by means of Fourier transform infrared (FT-IR) spectroscopy. In this test method, the incident radiation is p-polarized and...
Diese Norm gilt für Ausdrucke zahnärztlicher Röntgenaufnahmen auf nichttransparenten Medien, die zur Befundung vorgesehen sind. Die Norm legt Qualitätsanforderung
This part of IEC 61223 applies to the effectiveness of mammographic X-RAY EQUIPMENT, with respect to image quality and dose, in combination with aspects of EQUIPMENT safety. This standard applies to mammographic X-RAY EQUIPMENT and MAMMOGRAPHIC TEREOTACTIC DEVICES. The tests...