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BS 3042 - Test Probes to Verify Protection by Enclosures
August 15, 1992 - BSI

Gives details and dimensions of test probes intended to verify the protection provided by enclosure with regard to: a) protection of persons against access to hazardous parts inside the enclosure. b) protection of equipment inside the enclosure against ingress of solid foreign objects.

ISO DIS 2100-415 - Aerospace elements of electrical and optical connection - Test methods - Part 415: Test probe damage (female contact)
August 3, 2017 - ISO

This standard specifies a method of checking that the elastic system which ensures electrical contact is not damaged by the insertion of a test probe. It shall be used together with ISO 2100-100.

TS351-1 - TS351 Test for Electrical Connectors Test Probe Damage
October 1, 1985 - SAE Industry Technologies Consortia

This technical specification document describes tests that certain parts may be required to meet. For example, this tech spec applies to ESC30. To view suppliers qualified against this standard, visit https://ts200.sae-itc.org/ .

DS/EN 2591-415 - Aerospace series - Elements of electrical and optical connection - Test methods - Part 415: Test probe damage (female contacts)
December 21, 2001 - DS

This standard specifies a method of checking that the female contacts used in elements of electrical and optical connection are not damaged by the insertion of a test probe. It shall be used together with EN 2591-100.

ISO DIS 2100-6415 - Aerospace elements of electrical and optical connection - Test methods - Part 6415: Optical elements - Test probe damage
August 3, 2017 - ISO

This standard specifies a method of checking that the alignment system used for optical connection elements is not damaged by the insertion of a specified probe. It shall be used together with ISO 2100-100.

DS/EN 2591-6415 - Aerospace series - Elements of electrical and optical connection - Test methods - Part 6415: Optical elements - Test probe damage
January 24, 2002 - DS

This standard specifies a method of checking that the alignment system used for optical connection elements is not damaged by the insertion of a specified probe. It shall be used together with EN 2591-100.

EIA-364-25 - TP-25E Probe Damage Test Procedure for Electrical Connectors
March 1, 2017 - ECIA

This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of...

MS 3321 - TEST FIXTURE, PROBE DAMAGE, SOCKET CONTACT, CONNECTOR, ELECTRIC
NPFC
A description is not available for this item.
NFPA ELECTRICAL - ELECTRICAL INSPECTION MANUAL
NFPA
A description is not available for this item.
IEEE 1696 - Terminology and Test Methods for Circuit Probes
December 11, 2013 - IEEE

This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe...

EIA SP 3713 - PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
ECIA
A description is not available for this item.
DS/EN 60512-16-1 - Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
September 26, 2008 - DS

This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard...

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