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ASTM E1217 - STANDARD PRACTICE FOR DETERMINATION OF THE SPECIMEN AREA CONTRIBUTING TO THE DETECTED SIGNAL IN AUGER ELECTRON SPECTROMETERS AND SOME X-RAY PHOTOELECTRON SPECTROMETERS Organization: ASTM
Date: 2011-11-01
Description: The practice is applicable only to those X-ray photoelectron spectrometers in which the specimen area excited by the incident X-ray beam is larger than the specimen area viewed by the analyzer, in which the photoelectrons travel in a field-free region from the specimen to the analyzer entrance, and in which an auxiliary electron gun can be mounted to produce an electron beam of variable energy on the specimen.
SAE/TP - 2007-01-3079 - ON-ORBIT THERMAL PERFORMANCE OF THE HINODE (SOLAR-B) EXTREME ULTRAVIOLET IMAGING SPECTROMETER Organization: SAE/TP
Date: 2007-07-09
Description: The UK-led Extreme Ultraviolet Imaging Spectrometer (EIS) will image spectral lines within two carefully chosen wavelength bands, to observe the solar corona and upper transition regions in high spatial and temporal resolution.
SAE/TP - 2007-01-3081 - THERMAL CONTROL OF X-RAY ASTRONOMY SATELLITE ASTRO-E2 "SUZAKU" Organization: SAE/TP
Date: 2007-07-09
Description: It is equipped with X -ray telescopes (XRT) and three kinds of focal plane instruments, X-Ray Imaging Spectrometer (XIS), X-Ray Spectrometer (XRS) and Hard X-Ray Detector (HXD).
SAE/TP - 2009-01-2374 - THERMAL DESIGN OF THE MIXS MICRO-OPTICS FOR X-RAYING MERCURY Organization: SAE/TP
Date: 2009-07-12
Description: MIXS (Mercury Imaging X-ray Spectrometer) is an instrument in the remote sensing suite of the Mercury Planetary Orbiter (MPO), part of the Bepi-Colombo mission to Mercury.
ISO DIS 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS Organization: ISO
Date: 2016-11-25
Description: This International Standard is applicable to the crosssectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM), and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS).
ASTM C1723 - STANDARD GUIDE FOR EXAMINATION OF HARDENED CONCRETE USING SCANNING ELECTRON MICROSCOPY Organization: ASTM
Date: 2016-09-01
Description: This standard does not purport to address all of the safety concerns, if any, associated with the use of electron microscopes, X-ray spectrometers, chemicals, and equipment used to prepare samples for electron microscopy.

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