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JEDEC JEB 5 - METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS Organization: JEDEC
Date: 1970-01-01
Description: The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information.
DOD - SMD 5962-08242 - MICROCIRCUIT, HYBRID, HIGH SPEED LOGIC GATE 3.3V OPTOCOUPLER Organization: DOD
JEDEC JESD 390 - STANDARD TEST PROCEDURE FOR NOISE MARGIN MEASUREMENTS FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS Organization: JEDEC
Date: 1981-02-01
JEDEC - EIA-390 - TEST PROCEDURE FOR NOISE MARGIN MEASUREMENTS FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS Organization: JEDEC
DOD - SMD 5962-88768 - MICROCIRCUIT, HYBRID, DIGITAL, SINGLE CHANNEL, HIGH SPEED LOGIC GATE OPTICALLY COUPLED ISOLATOR Organization: DOD
DOD - SMD 5962-88769 - MICROCIRCUIT, HYBRID, DIGITAL, DUAL AND QUAD CHANNEL, HIGH SPEED LOGIC GATE OPTOCOUPLER Organization: DOD
DOD - SMD 5962-84031 - MICROCIRCUIT, DIGITAL, ADVANCED LOWPOWER SCHOTTKY TTL, LOGIC GATE WITH BUFFER OUTPUT, MONOLITHIC SILICON Organization: DOD
Date: 2015-03-25
Description: This drawing describes device requirements for MIL-STD-883 compliant, non-JAN...
DOD - SMD 5962-15238 - MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE, COMBINATIONAL, MANYGATE CONFIGURABLE LOGIC GATE WITH SCHMITT TRIGGER INPUTS AND TRI-STATE OUTPUTS, MONOLITHIC SILICON Organization: DOD
Date: 2016-03-30
Description: This drawing documents two product assurance class levels consisting of high ...
DOD - SMD 5962-15239 - MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, DUAL, SEQUENTIAL, MANYGATE CONFIGURABLE LOGIC GATE WITH SCHMITT TRIGGER INPUTS AND TRI-STATE OUTPUTS, MONOLITHIC SILICON Organization: DOD
Date: 2016-03-30
Description: This drawing documents two product assurance class levels consisting of high ...
DS/IEC 748-2-1 - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 2: DIGITAL INTEGRATED CIRCUITS - SECTION ONE - BLANK DETAIL SPECIFICATION FOR BIPOLAR MONOLITHIC DIGITAL INTEGRATED CIRCUIT GATES (EXCLUDING UNCOMMITTED LOGIC ARRAYS) Organization: DS
Date: 1993-03-05
Description: The standard gives blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays).
DOD - SMD 5962-91695 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY (600 GATES), MONOLITHIC SILICON Organization: DOD
Date: 2010-08-23
Description: This drawing documents two product assurance class levels consisting of high ...
BSI - BS QC 790132 - BIPOLAR MONOLITHIC DIGITAL INTEGRATED CIRCUIT GATES (EXCLUDING UNCOMMITTED LOGIC ARRAYS) Organization: BSI
Date: 1992-01-31
NPFC - MIL-M-38510/170 - MICROCIRCUITS, DIGITAL, CMOS, AND GATES, MONOLITHIC SILICON, POSITIVE LOGIC Organization: NPFC
NPFC - MIL-M-38510/171 - MICROCIRCUITS, DIGITAL, CMOS, OR GATES, MONOLITHIC SILICON, POSITIVE LOGIC Organization: NPFC
NPFC - MIL-M-38510/750 - MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NAND GATES, MONOLITHIC SILICON, POSITIVE LOGIC Organization: NPFC
NPFC - MIL-M-38510/757 - MICROCIRCUITS, DIGITAL, ADVANCED CMOS, BUFFER GATES, MONOLITHIC SILICON, POSITIVE LOGIC Organization: NPFC
NPFC - MIL-M-38510/50 - MICROCIRCUITS, DIGITAL, CMOS, NAND GATES, MONOLITHIC SILICON, POSITIVE LOGIC Organization: NPFC
NPFC - MIL-M-38510/52 - MICROCIRCUITS, DIGITAL, CMOS, NOR GATES, MONOLITHIC SILICON, POSITIVE LOGIC Organization: NPFC
DOD - SMD 5962-94733 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS 12000 GATE CONFIGURABLE LOGIC ARRAY, MONOLITHIC SILICON Organization: DOD
Date: 2014-02-20
Description: This drawing documents two product assurance class levels consisting of high ...
DOD - SMD 5962-94634 - MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 8000 GATE CONFIGURABLE LOGIC ARRAY, MONOLITHIC SILICON Organization: DOD
Date: 2014-02-19
Description: This drawing documents two product assurance class levels consisting of high ...

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