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NR/L3/MTC/ME0201/CAL301 ISSUE 1 - CALIBRATION OF 0-1 INCH & 0-25MM EXTERNAL MICROMETERS Organization: NR
Date: 2008-06-07
Description: Work Instruction for the internal calibration of 0 – 1 Inch and 0 – 25mm External Micrometers. To be used in the absence of a manufacturers calibration instruction.
ARMY - TB 9-5210-207-50 - CALIBRATION PROCEDURE FOR MICROMETERS, INSIDE (GENERAL) Organization: ARMY
UNI 9191 - ITALIAN LANGUAGE - CALIBRATION OF MICROMETER CALLIPERS FOR EXTERNAL MEASUREMENT Organization: UNI
ARMY - TB 9-4931-492-50 - CALIBRATION PROCEDURE FOR FRAME MICROMETER SK-D-4850-107 Organization: ARMY
Date: 1976-03-09
TAPPI TIP 0304-30 - CALIBRATION AND MAINTENANCE OF THE MANUALLY OPERATED MICROMETER Organization: TAPPI
Date: 2000-01-01
ARMY - TB 9-5210-204-35 - CALIBRATION PROCEDURE FOR MICROMETER CALIPER, TYPE I, CLASS 1 STYLE A, B, C, AND D, AND TYPE 1, CLASS 2 STYLE A, B, AND C (GGG-C-10.5) AND (GGG-C-10.5B) Organization: ARMY
Date: 1985-06-07
DLA - MIL-M-002241A - MICROSCOPE, STAGE MICROMETER Organization: DLA
Date: 1964-09-18
Description: This specification covers one type of microscope stage micrometer, suitable for use in the calibration of eyepiece micrometers.
ASTM F728 - STANDARD PRACTICE FOR PREPARING AN OPTICAL MICROSCOPE FOR DIMENSIONAL MEASUREMENTS Organization: ASTM
Date: 1981-06-26
Description: This practice is applicable for a microscope equipped with a micrometer attachment, such as an optical filar, video filar, optical image-shearing with optical or video display, optical image-scanning, or video image-scanning micrometer. Adjustment and calibration of the micrometer attachment is not included in this practice.
ASTM E1951 - STANDARD GUIDE FOR CALIBRATING RETICLES AND LIGHT MICROSCOPE MAGNIFICATIONS Organization: ASTM
Date: 2014-11-01
Description: It is recommended that the stage micrometer or scale used in the calibration should be traceable to the National Institute of Standards and Technology (NIST) or a similar organization.
ASTM E898 - STANDARD METHOD OF TESTING TOP-LOADING, DIRECT-READING LABORATORY SCALES AND BALANCES Organization: ASTM
Date: 1988-09-30
Description: The characteristics to be measured include the following:  warm-up,  off center errors,  repeatability, reproducibility, and precision,  accuracy and linearity,  hysteresis,  settling time,  temperature effects,  vernier or micrometer calibration, and resistance to external disturbances.
ASTM D7151 - STANDARD TEST METHOD FOR DETERMINATION OF ELEMENTS IN INSULATING OILS BY INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY (ICP-AES) Organization: ASTM
Date: 2015-05-01
Description: Analytical results are particle size dependent, and low results are obtained for particles larger than several micrometers.2  This test method determines the dissolved metals (which can originate from overheating or arcing, or both) and a portion of the particulate metals (which generally originate from a wear mechanism).
NBN - EN ISO 14978 - GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - GENERAL CONCEPTS AND REQUIREMENTS FOR GPS MEASURING EQUIPMENT (ISO 14978:2006) Organization: NBN
Date: 2006-08-31
Description: ISO 14978:2006 specifies the general requirements, terms and definitions of characteristics of simple GPS measuring equipment, e.g. micrometers, dial gauges, callipers, surface plates, height gauges, gauge blocks, but not necessarily excluding more complicated equipment.
NBN - EN ISO 14978 - GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - GENERAL CONCEPTS AND REQUIREMENTS FOR GPS MEASURING EQUIPMENT (ISO 14978:2006) Organization: NBN
Date: 2006-08-31
Description: ISO 14978:2006 specifies the general requirements, terms and definitions of characteristics of simple GPS measuring equipment, e.g. micrometers, dial gauges, callipers, surface plates, height gauges, gauge blocks, but not necessarily excluding more complicated equipment.
NBN - EN ISO 14978 - SPÉCIFICATION GÉOMÉTRIQUE DES PRODUITS (GPS) - CONCEPTS ET EXIGENCES GÉNÉRAUX POUR LES ÉQUIPEMENTS DE MESURE GPS (ISO 14978:2006) Organization: NBN
Date: 2006-08-31
Description: ISO 14978:2006 specifies the general requirements, terms and definitions of characteristics of simple GPS measuring equipment, e.g. micrometers, dial gauges, callipers, surface plates, height gauges, gauge blocks, but not necessarily excluding more complicated equipment.
ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE - FIRST EDITION Organization: ISO
Date: 2010-06-01
Description: This International Standard specifies the method of selected-area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse micrometer and sub-micrometer sized areas of thin crystalline specimens.
ASTM D5185 - STANDARD TEST METHOD FOR MULTIELEMENT DETERMINATION OF USED AND UNUSED LUBRICATING OILS AND BASE OILS BY INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY (ICP-AES) Organization: ASTM
Date: 2013-09-15
Description: Analytical results are particle size dependent, and low results are obtained for particles larger than a few micrometers.2 Elements present at concentrations above the upper limit of the calibration curves can be determined with additional, appropriate dilutions and with no degradation of precision.
JSA - JIS B 0642 - GEOMETRICAL PRODUCT SPECIFICATIONS (GPS)-GENERAL CONCEPTS AND REQUIREMENTS FOR GPS MEASURING EQUIPMENT Organization: JSA
Date: 2010-09-21
Description: This Standard specifies the general requirements, terms and definitions, and design and metrological characteristics of GPS measuring equipment, e.g. micrometers, dial gauges, callipers, height gauges, gauge blocks and it forms the basis for other related standards for measuring equipment.
ASTM E3060 - STANDARD GUIDE FOR SUBVISIBLE PARTICLE MEASUREMENT IN BIOPHARMACEUTICAL MANUFACTURING USING DYNAMIC (FLOW) IMAGING MICROSCOPY Organization: ASTM
Date: 2016-06-01
Description: Dynamic imaging microscopy is a useful technique for particle analysis and characterization (proteinaceous and other types) during product development, in-process and commercial release with a sensitive detection and characterization of subvisible particles at ≥2 and ≤100 micrometers (although smaller and larger particles may also be reported if data are available).
ASTM D7691 - STANDARD TEST METHOD FOR MULTIELEMENT ANALYSIS OF CRUDE OILS USING INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY (ICP-AES) Organization: ASTM
Date: 2016-06-01
Description: Analytical results are particle size dependent and low results may be obtained for particles larger than a few micrometers. The precision in Section 18 defines the concentration ranges covered in the interlaboratory study.

1 - 19 of 19 results