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VDI/VDE 2656 BLATT 1 - DETERMINATION OF GEOMETRICAL QUANTITIES BY USING OF SCANNING PROBE MICROSCOPES - CALIBRATION OF MEASUREMENT SYSTEMS Organization: VDI
Date: 2008-06-01
Description: This guideline is restricted to scanning probe microscopes and their calibration. A scanning probe microscope is a serially operating measuring device which uses a probe of adequate fineness to trace the surface of the object to be measured exploiting a local physical interaction (such as the quantum-mechanical tunnel effect, interatomic or intermolecular forces, evanescent modes of the electromagnetic field) with the probe and the object to be measured being displaced in relation to one another in a plane (hereinafter referred to as the x-y-plane) according to a defined pattern, while the signal of the interaction is recorded and can be used to control the distance between probe and object to be measured.
DIN - VDI/VDE 2656 BLATT 1 - DETERMINATION OF GEOMETRICAL QUANTITIES BY USING OF SCANNING PROBE MICROSCOPES - CALIBRATION OF MEASUREMENT SYSTEMS Organization: DIN
Date: 2008-06-01
VDI/VDE 2655 BLATT 1.2 - OPTICAL MEASUREMENT OF MICROTOPOGRAPHY - CALIBRATION OF CONFOCAL MICROSCOPES AND DEPTH SETTING STANDARDS FOR ROUGHNESS MEASUREMENT Organization: VDI
Date: 2010-10-01
Description: This guideline is limited to the basic calibration of imaging confocal microscopes. By confocal microscopes measuring instruments are understood whose underlying principle relies on the imaging of a point source onto the sample to be calibrated in the illumination branch and the imaging of the light, returning onto a corresponding point-type intensity sensor in the detection branch.
DIN - VDI/VDE 2655 BLATT 1.1 - OPTICAL MEASUREMENT AND MICROTOPOGRAPHIES - CALIBRATION OF INTERFERENCE MICROSCOPES AND DEPTH MEASUREMENT STANDARDS FOR ROUGHNESS MEASUREMENT Organization: DIN
Date: 2008-03-01
DIN - VDI/VDE 2655 BLATT 1.2 - OPTICAL MEASUREMENT OF MICROTOPOGRAPHY - CALIBRATION OF CONFOCAL MICROSCOPES AND DEPTH SETTING STANDARDS FOR ROUGHNESS MEASUREMENT Organization: DIN
Date: 2010-10-01
ISO 27911 - SURFACE CHEMICAL ANALYSIS - SCANNINGPROBE MICROSCOPY - DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE - FIRST EDITION Organization: ISO
Date: 2011-08-01
Description: This International Standard describes a method for determining the spatial (lateral) resolution of an apertured near-field scanning optical microscope (NSOM) by imaging an object with a size much smaller than the expected resolution.
ISO DIS 27911 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE Organization: ISO
ISO FDIS 27911 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE Organization: ISO
BSI - BS ISO 27911 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE Organization: BSI
Date: 2011-08-31
ISO 13083 - SURFACE CHEMICAL ANALYSIS - SCANNING PROBE MICROSCOPY - STANDARDS ON THE DEFINITION AND CALIBRATION OF SPATIAL RESOLUTION OF ELECTRICAL SCANNING PROBE MICROSCOPES (ESPMS) SUCH AS SSRM AND SCM FOR 2D-DOPANT IMAGING AND OTHER PURPOSES - FIRST EDITION Organization: ISO
Date: 2015-08-15
Description: This International Standard describes a method for measuring the spatial (lateral) resolution of scanning capacitance microscopes (SCMs) or scanning spreading resistance microscopes (SSRMs), which are widely used in imaging the distribution of carriers and other electrical properties in semiconductor devices.
BSI - BS ISO 13083 - SURFACE CHEMICAL ANALYSIS - SCANNING PROBE MICROSCOPY - STANDARDS ON THE DEFINITION AND CALIBRATION OF SPATIAL RESOLUTION OF ELECTRICAL SCANNING PROBE MICROSCOPES (ESPMS) SUCH AS SSRM AND SCM FOR 2D-DOPANT IMAGING AND OTHER PURPOSES Organization: BSI
Date: 2015-08-31
TSE - TS EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS-SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES-PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE-FOCUSING MICROSCOPE PROCEDURE Organization: TSE
Date: 2000-04-13
Description: This part of ISO 8503 specifies the focusing microscope and describes the procedure for calibrating ISO surface profile comparators complying with the requirements of ISO 8503-1.
ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS — SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES — PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE — FOCUSING MICROSCOPE PROCEDURE - SECOND EDITION Organization: ISO
Date: 2012-02-15
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
CEN - EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLASTCLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: CEN
Date: 2012-02-01
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
SNV - SN EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: SNV
Date: 2012-06-01
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
DS/EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: DS
Date: 2012-03-19
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503-1.
AFNOR - NF EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3 : METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: AFNOR
Date: 2012-04-01
BSI - BS EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: BSI
Date: 2012-03-31
SNV - SN EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: SNV
Date: 2012-06-01
SNV - SN EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: SNV
Date: 2012-06-01

1 - 20 of 47 results