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ASME B1.11 - MICROSCOPE OBJECTIVE THREAD - ERRATA - JULY 1972 Organization: ASME
Date: 1958-01-01
Description: This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain, generally known as the "RMS thread" and now almost universally accepted as the basic standard for microscope objectve mountings.
SPIE - OPTICAL DESIGN OF MICROSC - OPTICAL DESIGN OF MICROSCOPES Organization: SPIE
Date: 2010-01-01
Description: Several subsystems must be integrated: the source, the illumination optics, the specimen, the objective lens, the tube optics, and the sensor. The large numerical aperture of a microscope is essential for small spot size and high brightness; however, the large numerical aperture also presents difficult issues in optical design and fabrication.
ISO 19012-2 - MICROSCOPES - DESIGNATION OF MICROSCOPE OBJECTIVES - PART 2: CHROMATIC CORRECTION - SECOND EDITION Organization: ISO
Date: 2013-02-01
Description: The defined marking on the component enables the operator to correctly use the microscope. The standard application for visual observation refers to the combination of objective and tube lens as specified by the manufacturer.
ASTM E210 - STANDARD SPECIFICATION FOR MICROSCOPE OBJECTIVE THREAD Organization: ASTM
Date: 1963-09-30
Description: This standard covers the screw thread used for mounting the objective assembly to the body or lens turret of microscopes. It is based on, and intended to be interchangeable with, the screw thread introduced and adopted many years ago by the Royal Microscopical Society of Great Britain, generally known as the “RMS thread” and now almost universally accepted as the basic standard for microscope objective mountings.
ISO 19012-1 - MICROSCOPES - DESIGNATION OF MICROSCOPE OBJECTIVES - PART 1: FLATNESS OF FIELD/PLAN - THIRD EDITION Organization: ISO
Date: 2013-05-15
Description: This part of ISO 19012 specifies the use of the marking "Plan" on microscope objectives, and defines the diameter of the sharp region of the primary image of a flat object surface.
ASTM F728 - STANDARD PRACTICE FOR PREPARING AN OPTICAL MICROSCOPE FOR DIMENSIONAL MEASUREMENTS Organization: ASTM
Date: 1981-06-26
Description: This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to 12 µm, inclusive, on hardsurface photomasks and processed silicon wafers.
ISO 8038 - MICROSCOPES - SCREW THREADS FOR OBJECTIVES AND RELATED NOSEPIECES - THIRD EDITION Organization: ISO
Date: 2013-11-01
Description: This International Standard specifies the dimensions of screw thread types for connecting a microscope objective to the nosepiece. The use of these screw thread types is recommended for microscopes unless other fittings are required for optical or design reasons.
ISO 9345-2 - MICROSCOPES - IMAGING DISTANCES RELATED TO MECHANICAL REFERENCE PLANES - PART 2: INFINITY-CORRECTED OPTICAL SYSTEMS - SECOND EDITION Organization: ISO
Date: 2014-09-15
Description: This part of ISO 9345 specifies the imaging distances of objectives, eyepieces and the focal length of "normal" tube lenses of microscopes with infinity-corrected optical systems.
TSE - TS ISO 11882 - OPTICS AND OPTICAL INSTRUMEENTS-MICROSCOPES- İNTERFACING CONNECTION FOR 35 MM SLR PHOTO CAMERAS (T-THREAD ADAPTATION) Organization: TSE
Date: 1998-03-19
Description: This International Standard specifies the photo exit port of microscopes for connecting of 35 mm single lens reflecting (SLR) photo camreras, without image plane.
ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE - FIRST EDITION Organization: ISO
Date: 2010-06-01
Description: The minimum diameter of the selected area in a specimen which can be analysed by this method depends on the spherical aberration coefficient of the objective lens of the microscope and approaches 0,5 μm for a modern TEM.
ISO DIS 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE Organization: ISO
Date: 2017-01-12
Description: The minimum diameter of the selected area in a specimen which can be analysed by this method is restricted by the spherical aberration coefficient of the objective lens of the microscope and approaches several hundred nanometres for a modern TEM.
ASTM D4148 - STANDARD TEST METHOD FOR ANALYSIS OF PHYTOPLANKTON IN SURFACE WATER BY THE SEDGWICK-RAFTER METHOD Organization: ASTM
Date: 1982-06-25
Description: The Sedgwick Rafter (S-R) method requires less costly apparatus than does the inverted microscope method but gives less accurate results. The inherent inaccuracy in the Sedgwick- Rafter method is due to the design of the counting chamber and cannot be circumvented by a different choice of optics.
ISO 25297-1 - OPTICS AND PHOTONICS - ELECTRONIC EXCHANGE OF OPTICAL DATA - PART 1: NODIF INFORMATION MODEL - SECOND EDITION Organization: ISO
Date: 2012-03-01
Description: The following are within the scope: — information on product specification, optical design, optical evaluation and analysis; — optical systems and parts in imaging systems, such as cameras and copiers, viewing systems for telescopes and microscopes and the other optical systems, such as projectors and pick-up lenses; — — multiple-configuration optical systems, including zoom lenses and inner focusing systems; — optical path definition, including ray-path sequence and optical surface arrangement; — optical assemblies, including cemented parts and dynamic parts; — mathematical description of the optical surface form; — description of diffractive surfaces; — machining process designation, such as polishing, moulding or replicating; — optical material specifications, such as material names, lot numbers and measured refractive indices; — optical tolerances for the shape and material property of each optical part; — assembly tolerances, such as separation, parallelism, displacement and tilt; — effective diameters, coatings and protective surface treatment; — paraxial evaluation, such as focal length, back focal length, principal points and f-number; — ray-tracing evaluation, such as geometrical ray-tracing results (i.e. ray directions and intersection points on each surface and optical path lengths), aberrations and wavefront aberration; — OTF evaluation based on geometrical and/or physical optics; — illuminance distribution on a detection surface or a projection surface; — spectral characteristics; — ghost image evaluation; — thermal analysis accompanying optical surface deformation and material property value change; — stress analysis accompanying optical surface deformation and material property value change; — veiling glare and surface imperfections.
WILEY - POLARIZED LIGHT IN LIQUID - POLARIZED LIGHT IN LIQUID CRYSTALS AND POLYMERS COMPLETE DOCUMENT Organization: WILEY
Date: 2007-01-01
Description: An all-inclusive book, Polarized Light in Liquid Crystals and Polymers features: A focus on high-resolution structures found in modern display devices An introduction to optical properties of liquid crystal texture Novel coverage of three-dimensional anisotropic materials with respect to their light propagation properties Tools such as matrix methods, ray tracing, and space-grid time-domain techniques to effectively solve optical simulation problems A number of examples using measurements and simulation Coverage of how to use the polarization microscope to characterize textures and structures in liquid crystals and polymers An overview of photonic devices based on liquid crystals, covering the state of the art of existing systems Unique coverage of gradient-index based devices Over 200 illustrations and tables A thorough listing of references Presenting a comprehensive treatment of an exciting and rapidly developing field, Polarized Light in Liquid Crystals and Polymers provides both students and practitioners with a superlative resource for learning and reference.

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