Find the standard you are looking for at Engineering360. Documents are available for purchase from the IHS Standards Store.

1 - 20 of 25 results

VDI/VDE 2655 BLATT 1.2 - OPTICAL MEASUREMENT OF MICROTOPOGRAPHY - CALIBRATION OF CONFOCAL MICROSCOPES AND DEPTH SETTING STANDARDS FOR ROUGHNESS MEASUREMENT Organization: VDI
Date: 2010-10-01
Description: This guideline is limited to the basic calibration of imaging confocal microscopes. By confocal microscopes measuring instruments are understood whose underlying principle relies on the imaging of a point source onto the sample to be calibrated in the illumination branch and the imaging of the light, returning onto a corresponding point-type intensity sensor in the detection branch.
DIN - VDI/VDE 2655 BLATT 1.1 - OPTICAL MEASUREMENT AND MICROTOPOGRAPHIES - CALIBRATION OF INTERFERENCE MICROSCOPES AND DEPTH MEASUREMENT STANDARDS FOR ROUGHNESS MEASUREMENT Organization: DIN
Date: 2008-03-01
DIN - VDI/VDE 2655 BLATT 1.2 - OPTICAL MEASUREMENT OF MICROTOPOGRAPHY - CALIBRATION OF CONFOCAL MICROSCOPES AND DEPTH SETTING STANDARDS FOR ROUGHNESS MEASUREMENT Organization: DIN
Date: 2010-10-01
ISO 27911 - SURFACE CHEMICAL ANALYSIS - SCANNINGPROBE MICROSCOPY - DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE - FIRST EDITION Organization: ISO
Date: 2011-08-01
Description: This International Standard describes a method for determining the spatial (lateral) resolution of an apertured near-field scanning optical microscope (NSOM) by imaging an object with a size much smaller than the expected resolution.
BSI - BS ISO 27911 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE Organization: BSI
Date: 2011-08-31
ISO DIS 27911 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE Organization: ISO
ISO FDIS 27911 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE Organization: ISO
GOST R ISO 27911 - RUSSIAN LANGUAGE - STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS. SURFACE CHEMICAL ANALYSIS. SCANNING-PROBE MICROSCOPY. DEFINITION AND CALIBRATION OF THE LATERAL RESOLUTION OF A NEAR-FIELD OPTICAL MICROSCOPE Organization: GOST
ASTM F728 - STANDARD PRACTICE FOR PREPARING AN OPTICAL MICROSCOPE FOR DIMENSIONAL MEASUREMENTS Organization: ASTM
Date: 1981-06-26
Description: This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to 12 µm, inclusive, on hardsurface photomasks and processed silicon wafers.
DS/EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: DS
Date: 2012-03-19
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503-1.
CEN - EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLASTCLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: CEN
Date: 2012-02-01
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS — SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES — PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE — FOCUSING MICROSCOPE PROCEDURE - SECOND EDITION Organization: ISO
Date: 2012-02-15
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
SNV - SN EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE Organization: SNV
Date: 2012-06-01
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
NBN - EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE (ISO 8503-3:2012) Organization: NBN
Date: 2012-04-20
Description: ISO 8503-3:2012 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
NBN - EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE (ISO 8503-3:2012) Organization: NBN
Date: 2012-04-20
Description: ISO 8503-3:2012 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
AENOR - UNE-EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE (ISO 8503-3:2012) Organization: AENOR
Date: 2012-10-17
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
DIN EN ISO 8503-3 - PREPARATION OF STEEL SUBSTRATES BEFORE APPLICATION OF PAINTS AND RELATED PRODUCTS - SURFACE ROUGHNESS CHARACTERISTICS OF BLAST-CLEANED STEEL SUBSTRATES - PART 3: METHOD FOR THE CALIBRATION OF ISO SURFACE PROFILE COMPARATORS AND FOR THE DETERMINATION OF SURFACE PROFILE - FOCUSING MICROSCOPE PROCEDURE (ISO 8503-3:2012) Organization: DIN
Date: 2012-06-01
Description: This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1.
DS/EN 60970 - INSULATING LIQUIDS - METHODS FOR COUNTING AND SIZING PARTICLES Organization: DS
Date: 2007-10-11
Description: One uses an automatic particle size analyser, working on the light interruption principle. The other two use an optical microscope, in either the transmitted light or incident light mode, to count particles collected on the surface of a membrane filter.
IEC 60970 - INSULATING LIQUIDS – METHODS FOR COUNTING AND SIZING PARTICLES - EDITION 2.0 Organization: IEC
Date: 2007-07-01
Description: One uses an automatic particle size analyser, working on the light interruption principle. The other two use an optical microscope, in either the transmitted light or incident light mode, to count particles collected on the surface of a membrane filter.
DS/EN ISO 4499-2 - HARDMETALS - METALLOGRAPHIC DETERMINATION OF MICROSTRUCTURE - PART 2: MEASUREMENT OF WC GRAIN SIZE Organization: DS
Date: 2010-06-08
Description: This part of ISO 4499 essentially covers four main topics: . calibration of microscopes, to underpin the accuracy of measurements; . linear analysis techniques, to acquire sufficient statistically meaningful data; . analysis methods, to calculate representative average values; . reporting, to comply with modern quality requirements.

1 - 20 of 25 results