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This International Standard specifies measurement procedures for the precise determination of the high reflectance of optical laser components. Up to now, the ISO standardized testing methods for reflectance of optical laser components have the accuracy limit of approximately 0,01 % (for...
Adopts OTF measurement as an objective test method for ascertaining and expressing the performance of optical devices and systems, including image forming systems or assemblies and lenses but does not normally relate to the separate parts of a multi-component system. Specifically limited to tests...
This standard was transferred to SEMI (www.semi.org) May 2003 1.1 This test method covers determination of the absorption coefficient due to the interstitial oxygen content of commercial monocrystalline silicon wafers by means of Fourier transform infrared (FT-IR) spectroscopy. In this test method,...
This part of IEC 61496 specifies additional requirements for the design, construction and testing of electro-sensitive protective equipment (ESPE) designed specifically to detect persons or parts of persons as part of a safety related system, employing active opto electronic protective...
Replacement: This part of IEC 61496 specifies additional requirements for the design, construction and testing of non-contact electro-sensitive protective equipment (ESPE) designed specifically to detect persons as part of a safety related system, employing active opto-electronic protective...
This test method2 covers determination of the absorption coefficient due to the interstitial oxygen content of commercial monocrystalline silicon wafers by means of Fourier transform infrared (FT-IR) spectroscopy. In this test method, the incident radiation is p-polarized and incident on the test...
Replacement: This Standard specifies additional requirements for the design, construction and testing of non-contact electro-sensitive protective equipment (ESPE) designed specifically to detect persons as part of a safety related system, employing active opto-electronic protective devices...
This standard was transferred to SEMI (www.semi.org) May 2003 1.1 This test method covers the quantitative determination of elemental areal density on the surface of polished single crystal silicon substrates using total reflection X-ray fluorescence spectroscopy (TXRF) with a monochromatic X-ray...
1. Scope 1.1 This test method covers the quantitative determination of elemental areal density on the surface of polished single crystal silicon substrates using total reflection X-ray fluorescence spectroscopy (TXRF) with a monochromatic X-ray source. 1.2 This test method can be used for both...