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BSI - BS PD 0016 - DOCUMENT SCANNING. GUIDE TO SCANNING BUSINESS DOCUMENTS - TO PURCHASE CALL 1-800-854-7179 USA/CANADA OR 303-397-7956 WORLDWIDE Organization: BSI
Date: 2001-07-15
Description: Offers an insight into the processes of document scanning, explains the main features and benefits of different types of scanners and provides guidance to evaluate scanners to user requirements.
FAA-E-2014 REV A - TONE/SCAN CONTROL SYSTEM Organization: FAA
Date: 1970-02-03
Description: The equipment described in this specification is a solid-state, combined Tone/Scan Control System for two-way control and monitoring of remote radio facilities over a 300 to 3000 Hz telephone circuit.
NR/L3/INF/02236 ISSUE 2 - SCANNING OF DOCUMENTATION - COMPLIANCE DATE: 2 JUNE 2012; CONTAINS NR/L3/INF/02236/F003, NR/L3/INF/02236/F004 Organization: NR
Date: 2012-03-03
Description: This Network Rail standard specifies a scanning process for hard copy records and other documentation.
BRE DG492 - TIMBER GRADING AND SCANNING - CHRIS HOLLAND AND TIM REYNOLDS Organization: BRE
Date: 2005-03-15
Description: Timber for non-structural uses, such as furniture or flooring, may also be sorted to meet certain appearance grades. This Digest details advances in grading and scanning technology, for both logs and sawn timber, and changes to structural timber grading due to European harmonisation of standards.
PACKT - KALI LINUX NETWORK SCANNI - KALI LINUX NETWORK SCANNING COOKBOOK Organization: PACKT
Date: 2014-08-21
Description: "Kali Linux Network Scanning Cookbook" is intended for information security professionals and casual security enthusiasts alike.
SMPTE ST 2016-2 - FORMAT FOR PAN-SCAN INFORMATION Organization: SMPTE
Date: 2014-08-16
Description: This Standard defines Pan-Scan information for origination and conveyance through the production and distribution processes for standard definition or high definition television signals.
NASA-LLIS-0394 - LESSONS LEARNED - VOYAGER SCAN PLATFORM PROBLEMS Organization: NASA
Date: 1995-05-30
Description: Abstract: Near the end of the Voyager 2 Saturn encounter, the scan platform azimuth actuator seized, causing a scan platform pointing error that resulted in a loss of some data.
SAE J2201 - UNIVERSAL INTERFACE FOR OBD II SCAN Organization: SAE
Date: 1999-07-01
Description: SAE J1978 defines the requirements of the OBD II scan tool. SAE J2201 defines the minimum requirements of the vehicle communications interface for the SAE J1978 OBD II scan tool.
IEEE 1149.1 - TEST ACCESS PORT AND BOUNDARY-SCAN ARCHITECTURE - IEEE COMPUTER SOCIETY Organization: IEEE
Date: 2013-02-06
Description: This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: - Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate - Testing the integrated circuit itself - Observing or modifying circuit activity during the component's normal operation The test logic consists of a boundary-scan register and other building blocks and is accessed through a test access port (TAP).
ISO 22493 - MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - VOCABULARY - SECOND EDITION Organization: ISO
Date: 2014-04-15
Description: This International Standard defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
IEEE 1149.6 - BOUNDARY-SCAN TESTING OF ADVANCED DIGITAL NETWORKS - IEEE COMPUTER SOCIETY Organization: IEEE
Date: 2015-12-05
Description: This standard defines extensions to IEEE Std 1149.1™ to standardize the boundary-scan structures and methods required to help ensure simple, robust, and minimally intrusive boundary-scan testing of advanced digital networks.
ATIS 0300085 - TEST SPECIFICATION FOR PRODUCT LABEL SCANNING Organization: ATIS
Date: 2008-01-01
Description: ., service providers, telecommunications and Automatic Identification and Data Collection (AIDC) equipment manufacturers, Electronic Manufacturing Service (EMS) partners, Original Equipment Manufacturers (OEM)), providing results to the BCSC, and scanned using their hardware. The scanning results would then be collected and compiled to evaluate the ability of the two technologies to discriminate between labels placed in close proximity.
DS/EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD Organization: DS
Date: 1994-12-20
Description: This standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron microscope.
FAA - FO 8200.43 - FLIGHT INSPECTION OF THE MICROWAVE SCANNING BEAM LANDING SYSTEM (MSBLS) Organization: FAA
Date: 2004-04-30
Description: This order details the flight inspection procedures, requirements, and analysis for the evaluation of the Microwave Scanning Beam Landing System (MSBLS).
FAA-E-2348 - TUBE, SCAN CONVERSION STORAGE, TYPE 7539 (INCLUDES AMENDMENT 2) Organization: FAA
Date: 1968-05-14
Description: The 7539 Scan Conversion Storage Tube is a two-gun storage tube for use in a RADAR BRIGHT DISPLAY EQUIPMENT (RBDE-3) Type FA-6905 Scan Converter Equipment for transforming radar, beacon, and other forms of rho-theta video information into television information.
SMPTE ST 2016-4 - VERTICAL ANCILLARY DATA MAPPING OF PAN-SCAN INFORMATION Organization: SMPTE
Date: 2014-08-16
Description: This Standard defines a method of coding that allows Pan-Scan information to be carried in the 10-bit vertical ancillary (VANC) data space of a standard definition or high definition bit-serial component television signal.
ISO TS 24597 - MICROBEAM ANALYSIS — SCANNING ELECTRON MICROSCOPY — METHODS OF EVALUATING IMAGE SHARPNESS - FIRST EDITION Organization: ISO
Date: 2011-06-15
Description: This Technical Specification specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope (SEM) by means of a Fourier transform (FT) method, a contrast-to-gradient (CG) method and a derivative (DR) method.
VDI 3866 BLATT 5 - DETERMINATION OF ASBESTOS IN TECHNICAL PRODUCTS - SCANNING ELECTRON MICROSCOPY METHOD Organization: VDI
Date: 2004-10-01
Description: This guideline specifies a scanning electron microscopy method for the qualitative detection of asbestos in technical products whose asbestos mass content is at least 1%.
ISO 28600 - SURFACE CHEMICAL ANALYSIS — DATA TRANSFER FORMAT FOR SCANNING-PROBE MICROSCOPY - FIRST EDITION Organization: ISO
Date: 2011-07-01
Description: This International Standard specifies a format for the transfer of scanning-probe microscopy (SPM) data from computer to computer via parallel interfaces or via serial interfaces over direct wire, local area network, global network or other communication links.
DS/ISO/TR 12773-2 - BUSINESS REQUIREMENTS FOR HEALTH SUMMARY RECORDS - PART 2: ENVIRONMENTAL SCAN Organization: DS
Date: 2009-09-11
Description: This part of ISO/TR 12773 reviews a series of initiatives and implementations worldwide that for purposes of this Technical Report are collectively called health summary records (HSRs). It provides an environmental scan and descriptive information on HSR initiatives internationally, including "lessons learned".

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