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DS/EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD Organization: DS
Date: 1994-12-20
Description: This standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron microscope.
TSE - TS EN ISO 9220 - METALLIC COATINGS-MEASUREMENT OF COATING THICKNESS-SCANNING ELECTRON MICROSCOPE METHOD Organization: TSE
Date: 2001-02-06
Description: This standard, specifies a method for the measurement of the local thickness of metallic coating by examination of cross- section with a scanning electron microscope (SEM) Bu standard, tarayıcı elektron mikroskobu (TEM) kullanılarak metalik kaplamanın yerel kalınlığının ölçümü için bir metodu kapsar.
NBN - EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD (ISO 9220:1988) Organization: NBN
Date: 1995-02-01
Description: Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /µm, whichever is greater.
NBN - EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD (ISO 9220:1988) Organization: NBN
Date: 1995-02-01
Description: Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /µm, whichever is greater.
ASTM E766 - STANDARD PRACTICE FOR CALIBRATING THE MAGNIFICATION OF A SCANNING ELECTRON MICROSCOPE Organization: ASTM
Date: 2014-01-01
Description: This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions.2 Therefore, this practice must be applied to each set of standard operating conditions to be used.
ASTM E2142 - STANDARD TEST METHODS FOR RATING AND CLASSIFYING INCLUSIONS IN STEEL USING THE SCANNING ELECTRON MICROSCOPE Organization: ASTM
Date: 2008-10-01
Description: This test method covers procedures to obtain particle size distribution, chemical classification, and Test Methods E45 ratings of inclusions in steels using an automated scanning electron microscope (SEM) with X-ray analysis and automatic image analysis capabilities.
NPFC - DI-QCIC-80864 - SCANNING ELECTRON MICROSCOPE ANALYSIS REPORT Organization: NPFC
Date: 1989-06-22
NASA - GSFC S-311-P-12 - SCANNING ELECTRON MICROSCOPE INSPECTION OF SEMICON Organization: NASA
AFNOR - NF EN ISO 9220 - METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. Organization: AFNOR
Date: 1995-04-01
GSFC-S-311-39 - TRANSISTOR, MICROWAVE, SCANNING ELECTRON MICROSCOPE (SEM) INSPECTION PROCEDURE Organization: GSFC
Date: 1974-09-30
CEN - EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD Organization: CEN
Date: 1994-01-01
BSI - BS EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD - AMD 8499: APRIL 1995 Organization: BSI
Date: 1989-09-29
ASTM E986 - STANDARD PRACTICE FOR SCANNING ELECTRON MICROSCOPE BEAM SIZE CHARACTERIZATION Organization: ASTM
SNV - SN EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD (ISO 9220:1988) Organization: SNV
Date: 1995-01-01
DIN EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS WITH THE SCANNING ELECTRON MICROSCOPE METHOD (ISO 9220:1988) Organization: DIN
Date: 1995-01-01
SN - NS-EN ISO 9220:1994 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD (ISO 9220:1988) Organization: SN
Date: 1995-03-07
JSA - JIS R 1633 - SAMPLE PREPARATION METHOD OF FINE CERAMICS AND FINE CERAMIC POWDERS FOR SCANNING ELECTRON MICROSCOPE OBSERVATION Organization: JSA
Date: 1998-01-20
SEMI P36 - GUIDELINE FOR MAGNIFICATION REFERENCE FOR CRITICAL DIMENSION MEASUREMENT SCANNING ELECTRON MICROSCOPES (CD-SEMS) Organization: SEMI
AENOR - UNE-EN ISO 9220 - METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988). Organization: AENOR
Date: 1996-10-23
GOST 8.594 - STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS. SCANNING ELECTRON MICROSCOPES. METHOD FOR VERIFICATION Organization: GOST
Date: 2009-01-01

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