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GME 12584 PART 1 - TEMPERATURE SENSOR - REVISION 3; ENGLISH/GERMAN; THIS STANDARD MAY BE APPLIED ONLY FOR CURRENT PROGRAMS. IT IS INACTIVE FOR ALL FUTURE PROJECTS AND WITHOUT REPLACEMENT Organization: GME
Date: 2013-01-01
Description: This specification defines the general peformence requirements for sensor for measering of temperatures.
JEDEC JESD 22-A104 - TEMPERATURE CYCLING Organization: JEDEC
Date: 2014-10-01
Description: In dual-chamber cycling, the load is placed on a moving platform that shuttles between stationary chambers maintained at fixed temperatures. In triple-chamber temperature cycling there are three chambers and the load is moved between them.
VA - FED H-08-1 SEC 11615 - PREFABRICATED CONTROLLED TEMPERATURE ROOMS Organization: VA
Date: 2002-07-01
Description: This section specifies laboratory controlled temperature rooms.
IET - TEMPERATURE MEASUREMENT A - TEMPERATURE MEASUREMENT AND CONTROL Organization: IET
Date: 1988-01-01
Description: The book reviews developments in the following areas: temperature measurement; thermocouple; resistance thermometer; thermistors; radiation thermometry; temperature sensors; industrial temperature measurement problem; heat sources; temperature control and energy conservation.
SAE ARP485 - TEMPERATURE MEASURING DEVICES NOMENCLATURE Organization: SAE
Date: 1996-06-01
Description: This SAE Aerospace Recommended Practice (ARP) defines the nomenclature of temperature measuring devices. General temperature measurement related terms are defined first, followed by nomenclature specific to temperature measuring devices, particularly thermocouples.
PIP PCCTE001 - TEMPERATURE MEASUREMENT DESIGN CRITERIA Organization: PIP
Date: 2014-05-01
Description: Purpose This Practice provides requirements for temperature measurement equipment selection and for the design of temperature measurement systems.
VA 13 21 29 - CONSTANT TEMPERATURE ROOMS Organization: VA
Date: 2011-11-01
Description: DESCRIPTION This section specifies laboratory controlled temperature rooms.
NPFC - A-A-59952 - CONTROL, HUMIDITY-TEMPERATURE RECORDING Organization: NPFC
Date: 2014-05-15
Description: This commercial item description (CID) describes a Control, Humidity-Temperature Recording hereinafter referred to as a Humidity-Temperature Recorder consisting of a single unit with an easy to use interface for the user.
JEDEC JESD 22-A119 - LOW TEMPERATURE STORAGE LIFE Organization: JEDEC
Date: 2015-10-01
Description: Low Temperature storage test is typically used to determine the effect of time and temperature, under storage conditions, for thermally activated failure mechanisms of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms).
NPFC - MIL-DTL-27723 - PROBE, TOTAL TEMPERATURE, DEICEABLE Organization: NPFC
Date: 2013-07-16
Description: This document covers the requirements for total temperature probes capable of operating during atmospheric icing conditions.
PIP PCETE001 - TEMPERATURE MEASUREMENT GUIDELINES Organization: PIP
Date: 2014-05-01
Description: This Practice describes the requirements for selecting thermocouples, resistance temperature detectors, thermowells, thermistors, pyrometers, filled thermal systems, bimetallic thermometers, temperature transmitters, and receiver devices.
JEDEC JESD 22-A105 - POWER AND TEMPERATURE CYCLING Organization: JEDEC
Date: 2004-01-01
Description: This test method applies to semiconductor devices that are subjected to temperature excursions and required to power on and off during all temperatures. The power and temperature cycling test is performed to determine the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed.
TAPPI TIP 0404-39 - DRYER SURFACE TEMPERATURE MEASUREMENT Organization: TAPPI
Date: 2012-01-01
Description: To produce high rates of heat transfer to the sheet, high dryer surface temperatures are necessary. In order to achieve high quality, a uniform temperature is needed across the width of the dryers.
WILEY - TEMPERATURE MEASUREMENT - TEMPERATURE MEASUREMENT 2ND EDITION Organization: WILEY
Date: 2002-01-01
Description: Featuring: * Brand new chapters on computerised temperature measuring systems and temperature measurement in medicine. * Sections on noise thermometers, the development of photoelectric and two-wave pyrometers and the latest IEC (International Electrotechnical Commission) standards * Coverage of fibre optic thermometers, imaging of temperature fields and measurement in hazardous areas
TSE - TS 3390 - PRESSURE AND TEMPERATURE VOCABULARY Organization: TSE
Date: 1979-04-26
Description: This standard covers the vocabulary of pressure and temperature. Bu standard, tesis elemanlarında kullanılan basınç ve sıcaklıklarla ilgili terimlerin tsanımlarını kapsar.
FORD M5B404-B - CLEANER, ALKALINE, AMBIENT TEMPERATURE - SHOWN ON M5B404-A Organization: FORD
Date: 1995-12-01
Description: SCOPE: The materials defined by this standard is a liquid alkaline cleaner used in washers at ambient temperatures.
IPC - TM-650 3.14 - HIGH TEMPERATURE LIFE, CONNECTORS Organization: IPC
Date: 1975-07-01
Description: To determine the effects of exposure to elevated ambient temperature on the electrical and mechanical characteristics of a connector.
FORD M5B404-A - CLEANER, ALKALINE, AMBIENT TEMPERATURE Organization: FORD
Date: 1995-12-01
Description: SCOPE: The materials defined by this standard is a liquid alkaline cleaner used in washers at ambient temperatures.
DELPHI-I - DELPHI DX900012 - HIGH TEMPERATURE HUMIDITY AGING Organization: DELPHI-I
Date: 1999-06-01
Description: SCOPE This procedure shall be used to evaluate the resistance of plastic materials to high temperature humidity aging.
JEDEC JESD 22-A103 - HIGH TEMPERATURE STORAGE LIFE Organization: JEDEC
Date: 2015-10-01
Description: The high temperature storage test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure mechanisms and time-tofailure distributions of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms).

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