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ASTM E1172 - STANDARD PRACTICE FOR DESCRIBING AND SPECIFYING A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER Organization: ASTM
Date: 2016-06-01
Description: This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance.
IEC 60759 - STANDARD TEST PROCEDURES FOR SEMICONDUCTOR X-RAY ENERGY SPECTROMETERS - EDITION 1.0; INCLUDES AMENDMENT 1: 1991 Organization: IEC
Date: 1983-01-01
Description: This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
IEEE 759 - STANDARD TEST PROCEDURES FOR SEMICONDUCTOR X-RAY ENERGY SPECTROMETERS Organization: IEEE
Date: 1984-01-01
Description: (This Foreword is not a part of ANSI/IEEE Std 759-1984, IEEE Standard Test Procedures for Semiconductor Energy X-Ray Spectrometers.)This document presents standard test procedures for semiconductor X-ray energy spectrometers.
TSE - TS IEC 60759 - STANDARD TEST PROCEDURES FOR SEMICONDUCTOR X-RAY ENERGY SPECTROMETERS Organization: TSE
Date: 2003-02-05
Description: This standard presents standard test procedures for emiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyser/computer
ASTM F1375 - STANDARD TEST METHOD FOR ENERGY DISPERSIVE X-RAY SPECTROMETER (EDX) ANALYSIS OF METALLIC SURFACE CONDITION FOR GAS DISTRIBUTION SYSTEM COMPONENTS Organization: ASTM
Date: 1992-02-15
Description: Limitations: This test method is intended for use by scanning electron microscope/energy dispersive x-ray spectrometer (SEM/EDX) operators with skill level typically achieved over a twelve-month period.
ISO 15632 - MICROBEAM ANALYSIS - SELECTED INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGYDISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS - SECOND EDITION Organization: ISO
Date: 2012-08-01
Description: This International Standard defines the most important quantities that characterize an energy-dispersive X-ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts.
DIN ISO 15632 - MICROBEAM ANALYSIS - SELECTED INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGY-DISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS (ISO 15632:2012) Organization: DIN
Date: 2015-11-01
Description: This International Standard defines the most important quantities that characterize an energy-dispersive Xray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts.
ASTM E902 - STANDARD PRACTICE FOR CHECKING THE OPERATING CHARACTERISTICS OF X-RAY PHOTOELECTRON SPECTROMETERS Organization: ASTM
Date: 2005-04-01
Description: This practice covers a procedure for checking some of the operating characteristics of an X-ray photoelectron spectrometer. Tests herein provide checks of the repeatability of intensity measurements and the drift of the intensities with time.
ISO 15472 - SURFACE CHEMICAL ANALYSIS — X-RAY PHOTOELECTRON SPECTROMETERS — CALIBRATION OF ENERGY SCALES - SECOND EDITION Organization: ISO
Date: 2010-05-01
Description: This International Standard specifies a method for calibrating the binding-energy scales of X-ray photoelectron spectrometers, for general analytical purposes, using unmonochromated Al or Mg X-rays or monochromated Al X-rays.
TSE - TS ISO 15472 - -SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROMETERS - CALIBRATION OF ENERGY SCALES Organization: TSE
Date: 2004-04-08
Description: This standard specifies a method for calibrating the binding-energy scales of x-ray photoelectron spectrometers, for general analytical purposes, using unmonochromatttted Al or Mg x-rays or monochromated Al X-rays.
ASTM E2108 - STANDARD PRACTICE FOR CALIBRATION OF THE ELECTRON BINDING-ENERGY SCALE OF AN X-RAY PHOTOELECTRON SPECTROMETER Organization: ASTM
Date: 2016-11-01
Description: This practice describes a procedure for calibrating the electron binding-energy (BE) scale of an X-ray photoelectron spectrometer that is to be used for performing spectroscopic analysis of photoelectrons excited by unmonochromated aluminum or magnesium Kα X-rays or by monochromated aluminum Kα X-rays The calibration of the BE scale is recommended after the instrument is installed or modified in any substantive way.
ISO TR 18231 - IRON ORES - WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETERS - DETERMINATION OF PRECISION - FIRST EDITION Organization: ISO
Date: 2016-05-01
Description: This Technical Report describes methods of test that can be applied to wavelength dispersive X-ray fluorescence (WD-XRF) spectrometers to ensure that the spectrometers are functioning in a manner that allows precise analyses to be made.
ASTM E1217 - STANDARD PRACTICE FOR DETERMINATION OF THE SPECIMEN AREA CONTRIBUTING TO THE DETECTED SIGNAL IN AUGER ELECTRON SPECTROMETERS AND SOME X-RAY PHOTOELECTRON SPECTROMETERS Organization: ASTM
Date: 2011-11-01
Description: The practice is applicable only to those X-ray photoelectron spectrometers in which the specimen area excited by the incident X-ray beam is larger than the specimen area viewed by the analyzer, in which the photoelectrons travel in a field-free region from the specimen to the analyzer entrance, and in which an auxiliary electron gun can be mounted to produce an electron beam of variable energy on the specimen.
ISO 16129 - SURFACE CHEMICAL ANALYSIS — X-RAY PHOTOELECTRON SPECTROSCOPY — PROCEDURES FOR ASSESSING THE DAY-TO-DAY PERFORMANCE OF AN X-RAY PHOTOELECTRON SPECTROMETER - FIRST EDITION Organization: ISO
Date: 2012-01-27
Description: The standard is intended for use with commercial Xray photoelectron spectrometers equipped with a monochromated Al Kα Xray source or with an unmonochromated Al or Mg Kα X‑ray source.
ASTM E1172 + REDLINE - STANDARD PRACTICE FOR DESCRIBING AND SPECIFYING A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER - INCLUDES STANDARD + REDLINE (PDF) Organization: ASTM
CEI 45-35 - STANDARD TEST PROCEDURES FOR SEMICONDUCTORS X-RAY ENERGY SPECTROMETERS - PRIMA EDIZIONE Organization: CEI
Date: 1997-09-01
Description: La Normadescrive i metodi di prova normalizzati per gli spettrometri per raggi X a semiconduttore.La presente Norma costituisce la ristampa senza modifiche, secondo il nuovo progetto di veste editoriale, della Norma pari numero ed edizione (Fascicolo 1011).
SAC - GB/T 11685-89 - TEST PROCEDURES FOR SEMICONDUCTOR X-RAY ENERGY SPECTROMETERS Organization: SAC
Date: 1989-10-14
BIS - IS 12737 - STANDARD TEST PROCEDURES FOR SEMICONDUCTOR X-RAY ENERGY SPECTROMETERS Organization: BIS
Date: 1988-01-01
ISO FDIS 15632 - MICROBEAM ANALYSIS - INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGY-DISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS Organization: ISO
BSI - BS ISO 15632 - MICROBEAM ANALYSIS - SELECTED INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGY-DISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS Organization: BSI
Date: 2012-08-31

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