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QUALIFIED PRODUCT LIST OF PRODUCTS QUALIFIED UNDER PERFORMANCE SPECIFICATION MIL-PRF-55342 Resistor, Chip, Fixed, Film, Nonestablished Reliability, Established Reliability, Space Level, General Specification for This list has been prepared for use by or for the Government in the acquisition...
This document specifies a calculation method for oil-lubricated hydrodynamic plain bearings with complete separation of the thrust collar and tilting pad thrust bearing surfaces by a film of lubricant. This document applies to plain thrust bearings with tilting-type sliding blocks (tilting...
The reference radiographs provided in the adjunct to this standard illustrate various types and degrees of discontinuities occurring in thin-wall steel investment castings.2 Use of this standard for the specification or grading of castings requires procurement of the adjunct reference radiographs...
These reference radiographs2 illustrate various categories, types, and severity levels of discontinuities occurring in steel castings that have section thicknesses up to 2 in. (50.8 mm) (see Note 2). The reference radiograph films are an adjunct to this standard and must be purchased...
This document specifies a test procedure for the preparation of test prints on paper, board, metals, foils and other suitable substrates using paste inks, such as for offset and letterpress printing, using electrically driven IGT-type and prüfbau-type printability testers. This document describes...
This book summarizes the results of studies of molecules and molecular complexes using techniques based on surface plasmon resonance (SPR) in a novel scientific direction called molecular plasmonics. It presents the current state of investigations in the field of molecular plasmonics and discusses...
This document is applicable to biodegradable plastic materials used to produce mulch films or biodegradable mulch films ready to be used for mulch applications in agriculture and horticulture. Biodegradable mulch films are not designed to be recovered, but to be incorporated...
This document specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with parallel X-ray beam. This document is applicable to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure.
IEC 60747-17:2020(E) specifies the terminology, essential ratings, characteristics, safety test and the measuring methods of magnetic coupler and capacitive coupler. It specifies the principles and requirements of insulation and isolation characteristics for magnetic and capacitive couplers for...
