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BSI - BS ISO 16700

Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

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Organization: BSI
Publication Date: 31 July 2016
Status: active
Page Count: 30
ICS Code (Optical equipment): 37.020

Document History

BS ISO 16700
July 31, 2016
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
A description is not available for this item.
September 29, 2004
Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
A description is not available for this item.

References

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