UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

IEC TS 61586

Estimation of the reliability of electrical connectors

active, Most Current
Buy Now
Organization: IEC
Publication Date: 1 January 2017
Status: active
Page Count: 60
ICS Code (Plug-and-socket devices. Connectors): 31.220.10
scope:

This technical specification deals with the estimation of the inherent design reliability of electrical connectors through the definition and development of an appropriate accelerated testing programme. The basic intrinsic degradation mechanisms of connectors, which are those mechanisms which exist as a result of the materials and geometries chosen for the connector design, are reviewed to provide a context for the development of the desired test programme. While extrinsic degradation mechanisms may also significantly affect the performance of connectors, they vary widely by application and thus are not addressed in this document.

Document History

IEC TS 61586
January 1, 2017
Estimation of the reliability of electrical connectors
This technical specification deals with the estimation of the inherent design reliability of electrical connectors through the definition and development of an appropriate accelerated testing...
February 1, 1997
Estimation of the Reliability of Electrical Connectors
A description is not available for this item.

References

Advertisement