Electric components – Reliability – Reference conditions for failure rates and stress models for conversion
|Publication Date:||1 February 2017|
|ICS Code (Electronic components in general):||31.020|
This document gives guidance on the use of failure rate data for reliability prediction of electric components used in equipment.
The method presented in this document uses the concept of reference conditions which are the typical values of stresses that are observed by components in the majority of applications.
Reference conditions are useful since they provide a known standard basis from which failure rates can be modified to account for differences in environment from the environments taken as reference conditions. Each user can use the reference conditions defined in this document or use their own. When failure rates stated at reference conditions are used it allows realistic reliability predictions to be made in the early design phase.
The stress models described herein are generic and can be used as a basis for conversion of failure rate data given at these reference conditions to actual operating conditions when needed and this simplifies the prediction approach. Conversion of failure rate data is only possible within the specified functional limits of the components.
This document also gives guidance on how a database of component failure data can be constructed to provide failure rates that can be used with the included stress models. Reference conditions for failure rate data are specified, so that data from different sources can be compared on a uniform basis. If failure rate data are given in accordance with this document then additional information on the specified conditions can be dispensed with.
This document does not provide base failure rates for components - rather it provides models that allow failure rates obtained by other means to be converted from one operating condition to another operating condition.
The prediction methodology described in this document assumes that the parts are being used within its useful life. The methods in this document have a general application but are specifically applied to a selection of component types as defined in Clauses 6 to 20 and I.2.