ECIA - EIA-364-25
TP-25E Probe Damage Test Procedure for Electrical Connectors
Organization: | ECIA |
Publication Date: | 1 March 2017 |
Status: | active |
Page Count: | 13 |
scope:
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:
- to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;
- to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).