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ECIA - EIA-364-25

TP-25E Probe Damage Test Procedure for Electrical Connectors

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Organization: ECIA
Publication Date: 1 March 2017
Status: active
Page Count: 13
scope:

This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:

- to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;

- to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).

Document History

EIA-364-25
March 1, 2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
March 1, 2017
TP-25E Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
November 1, 2010
TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
May 1, 1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
May 1, 1998
TP-25C Probe Damage Test Procedure for Electrical Connectors
This standard establishes a test method to be followed for probe damage testing, intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts...
April 1, 1997
TP-25B Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.
April 1, 1997
TP-25B Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.
January 1, 1983
TP-25A Probe Damage Test Procedure for Electrical Connectors
A description is not available for this item.

References

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