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JEDEC JESD 22-A108

Temperature, Bias, and Operating Life

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Organization: JEDEC
Publication Date: 1 July 2017
Status: active
Page Count: 14
scope:

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices' operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortalityrelated failures. The detailed use and application of burn-in is outside the scope of this document.

Document History

JEDEC JESD 22-A108
July 1, 2017
Temperature, Bias, and Operating Life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily...
December 1, 2016
Temperature, Bias, and Operating Life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily...
November 1, 2010
Temperature, Bias, and Operating Life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices' operating condition in an accelerated way, and is primarily...
June 1, 2005
Temperature, Bias, and Operating Life
A revised method for determining the effects of bias conditions and temperature, over time, on solid state devices is now available. Revision B of A108 includes low temperature operating life (LTOL)...
December 1, 2000
Temperature, Bias, and Operating Life
A description is not available for this item.
March 1, 1991
Bias Life (Revision of Test Method A108 - Previously Published in JESD22)
A description is not available for this item.

References

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