IEC TR 63133
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
active, Most Current
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| Organization: | IEC |
| Publication Date: | 1 October 2017 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
Document History
IEC TR 63133
October 1, 2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be...