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DOD - SMD 5962-96515

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 30 October 2017
Status: active
Page Count: 26
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More

Document History

SMD 5962-96515
October 30, 2017
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 9, 2012
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 11, 2011
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 3, 2008
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 27, 2008
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 4, 2007
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
June 11, 2001
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
November 25, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
May 13, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUADRUPLE 2-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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