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DLA - DSCC-VID-V62/13623 REV B

MICROCIRCUIT, DIGITAL-LINEAR, QUADRUPLE RS-485 DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 9 February 2017
Status: active
Page Count: 16
scope:

This drawing documents the general requirements of a high performance quadruple RS-485 differential line driver microcircuit, with an operating temperature range of -40°C to +85°C for device type 01 and -55°C to +125°C for device type 02.

Document History

DSCC-VID-V62/13623 REV B
February 9, 2017
MICROCIRCUIT, DIGITAL-LINEAR, QUADRUPLE RS-485 DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance quadruple RS-485 differential line driver microcircuit, with an operating temperature range of -40°C to +85°C for device type 01...
DSCC-VID-V62/13623 REV A
December 14, 2016
MICROCIRCUIT, DIGITAL-LINEAR, QUADRUPLE RS-485 DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance quadruple RS-485 differential line driver microcircuit, with an operating temperature range of -40°C to +85°C for device type 01...
DSCC-VID-V62/13623
October 31, 2013
MICROCIRCUIT, DIGITAL-LINEAR, QUADRUPLE RS-485 DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance quadruple RS-485 differential line driver microcircuit, with an operating temperature range of -40°C to +85°C.

References

This document references:
JEP95 BOOK 1 - Book One Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
PREFACE This Publication contains those solid state product outlines and other associated drawings that have been registered and assigned a JEDEC designation and are printed on white paper. Product...
This document references:
JEP95 BOOK 2 - Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
A description is not available for this item.
This document references:
JEDEC JESD 51-2 - Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
Published by JEDEC on January 1, 2008
This document outlines the environmental conditions necessary to ensure accuracy and repeatability for a standard junction-to-ambient thermal resistance measurement in natural convection.
This document references:
JESD51-51A - Implementation Of The Electrical Test Method For The Measurement Of Real Thermal Resistance And Impedance Of Light-Emitting Diodes With Exposed Cooling Surface
Published by JEDEC on October 1, 2022
This document specifies thermal testing procedures for power light-emitting diodes (power LEDs) and/or high brightness light-emitting diodes (HB LEDs) – in the following referred to as LEDs – which...
This document references:
JEDEC JESD 51-8 - Integrated Circuit Thermal Test Method Environmental Conditions - Junction-to-Board
Published by JEDEC on October 1, 1999
This specification should be used in conjunction with the overview document JESD51, Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device) [1] and the electrical...
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