BSI - BS EN IEC 60749-12
Semiconductor devices - Mechanical and climatic test methods Part 12: Vibration, variable frequency
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| Organization: | BSI |
| Publication Date: | 30 April 2018 |
| Status: | active |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN IEC 60749-12
April 30, 2018
Semiconductor devices - Mechanical and climatic test methods Part 12: Vibration, variable frequency
A description is not available for this item.
September 10, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 12: Vibration, Variable Frequency
A description is not available for this item.