NEN-EN-IEC 60749-43
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2017 |
| Status: | inactive |
| Page Count: | 86 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
NEN-EN-IEC 60749-43 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Document History
NEN-EN-IEC 60749-43
September 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
NEN-EN-IEC 60749-43 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.