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IEC/TS 61000-5-9

Electromagnetic compatibility (EMC) – Part 5-9: Installation and mitigation guidelines – System-level susceptibility assessments for HEMP and HPEM

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Organization: IEC
Publication Date: 1 July 2009
Status: active
Page Count: 70
ICS Code (Immunity): 33.100.20
scope:

The aim of this part of IEC 61000 is to present a methodology to assess the impact of Highaltitude Electromagnetic Pulse (HEMP) and High Power Electromagnetic (HPEM) environments on electronic systems. In this context a system refers to a collection of subsystems, equipment and components brought together to perform a function. (A more complete definition is given in 3.20.) The techniques associated with this methodology and their advantages and disadvantages will be presented along with examples of how the techniques can be applied to evaluate the susceptibility of electronic systems such as those found in installations. This work is closely related to the evaluation of EMC system level susceptibility.

The purpose of this Technical Specification is to provide information on available methods for the assessment of system-level susceptibility as a result of HEMP and HPEM environments. The advantages and disadvantages of the methods will be discussed along with examples of how the techniques should be employed.

Typical systems have external connections, wired or wireless, and the assessment of these are included within this specification.

This specification gives general guidance. It does not cover safety issues nor does it conflict with ITU-T efforts concerning the protection of telecommunications equipment [2]2.

2 Figures in square brackets refer to the Bibliography.

Document History

IEC/TS 61000-5-9
July 1, 2009
Electromagnetic compatibility (EMC) – Part 5-9: Installation and mitigation guidelines – System-level susceptibility assessments for HEMP and HPEM
The aim of this part of IEC 61000 is to present a methodology to assess the impact of Highaltitude Electromagnetic Pulse (HEMP) and High Power Electromagnetic (HPEM) environments on electronic...

References

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