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IEC 62416

Semiconductor devices – Hot carrier test on MOS transistors

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Organization: IEC
Publication Date: 1 April 2010
Status: active
Page Count: 24
ICS Code (Semiconductor devices): 31.080
scope:

This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Document History

IEC 62416
April 1, 2010
Semiconductor devices – Hot carrier test on MOS transistors
This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required...

References

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