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IEC 62415

Semiconductor devices – Constant current electromigration test

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Organization: IEC
Publication Date: 1 May 2010
Status: active
Page Count: 26
ICS Code (Semiconductor devices): 31.080
scope:

This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Document History

IEC 62415
May 1, 2010
Semiconductor devices – Constant current electromigration test
This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

References

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