JEDEC JESD 354
The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz
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| Organization: | JEDEC |
| Publication Date: | 1 April 1968 |
| Status: | active |
| Page Count: | 14 |
scope:
GENERAL
The test set-up must be very well shielded, grounded, and securely interconnected to prevent pick-up of unwanted signals and generation of additional noise.
Document History
JEDEC JESD 354
April 1, 1968
The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz
GENERAL
The test set-up must be very well shielded, grounded, and securely interconnected to prevent pick-up of unwanted signals and generation of additional noise.
April 1, 1968
Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies up to 20 kHz, Measurement of
This standard provides a method for determining values, for device registration purposes, for transistor equivalent noise voltage and equivalent noise current at frequencies up to 20 kHz. This method...