DIN EN IEC 60749-13
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018
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| Organization: | DIN |
| Publication Date: | 1 October 2018 |
| Status: | active |
| Page Count: | 15 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN IEC 60749-13
October 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018
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