CEI EN IEC 62969-4
Semiconductor devices - Semiconductor interface for automotive vehicles Part 4: Evaluation method of data interface for automative vehivle sensors
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| Organization: | CEI |
| Publication Date: | 1 November 2018 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 62969 specifies a method of directly fault injection test for automotive semiconductor sensor interlace that can be used to support the conformance assurance in the vehicle communications interface.
Document History
CEI EN IEC 62969-4
November 1, 2018
Semiconductor devices - Semiconductor interface for automotive vehicles Part 4: Evaluation method of data interface for automative vehivle sensors
This part of IEC 62969 specifies a method of directly fault injection test for automotive semiconductor sensor interlace that can be used to support the conformance assurance in the vehicle...