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IEC 60749-17

Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation

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Organization: IEC
Publication Date: 1 March 2019
Status: active
Page Count: 22
ICS Code (Semiconductor devices in general): 31.080.01
scope:

The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.

The objectives of the test are as follows:

a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and

b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).

Document History

IEC 60749-17
March 1, 2019
Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to...
February 1, 2003
Semiconductor devices Mechanical and climatic test methods Part 17: Neutron irradiation
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References

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