IEC 60747-18-1
Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors
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| Organization: | IEC |
| Publication Date: | 1 May 2019 |
| Status: | active |
| Page Count: | 30 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
Document History
IEC 60747-18-1
May 1, 2019
Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors
This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process,...