DIN IEC 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing; Charged device model (CDM) (IEC 47/1658/CD:2002)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 February 2003 |
| Status: | inactive |
| Page Count: | 20 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN IEC 60749-28
February 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing; Charged device model (CDM) (IEC 47/1658/CD:2002)
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