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IEC 60749-7

Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal moisture content measurement and the analysis of other residual gases

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Organization: IEC
Publication Date: 1 June 2011
Status: active
Page Count: 26
ICS Code (Semiconductor devices in general): 31.080.01
scope:

This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.

Document History

IEC 60749-7
June 1, 2011
Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal moisture content measurement and the analysis of other residual gases
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a...
August 1, 2003
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 7: Internal Moisture Content Measurement and the Analysis of Other Residual Gases CORRIGENDUM 1
A description is not available for this item.
April 1, 2002
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 7: Internal Moisture Content Measurement and the Analysis of Other Residual Gases
A description is not available for this item.

References

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