Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal moisture content measurement and the analysis of other residual gases
|Publication Date:||1 June 2011|
|ICS Code (Semiconductor devices in general):||31.080.01|
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.