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DIN IEC/TS 61994-4-4

Piezoelektrische und dielektrische Bauteile zur Frequenzstabilisierung und -selektion - Woerterverzeichnis - Teil 4-4: Materialien - Materialien fuer Oberflaechen-(OFW-)Bauelemente (IEC/TS 61994-4-4:2010)

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Organization: DIN
Publication Date: 1 November 2011
Status: active
Page Count: 12
ICS Code (Piezoelectric devices): 31.140
ICS Code (Electronics (Vocabularies)): 01.040.31
scope:

Dieser Teil von IEC 61994 legt Begriffe für Einkristall-Wafer, die für dem neuesten Stand der Technik entsprechende Oberflächenwellenbauelemente (engl.: surface acoustic wave - SAW) verwendet werden, fest. Diese Begriffe sind für die Anwendung in Normen und Schriftstücken des Technischen Komitees IEC/TC 49 vorgesehen.

Document History

DIN IEC/TS 61994-4-4
November 1, 2011
Piezoelektrische und dielektrische Bauteile zur Frequenzstabilisierung und -selektion - Woerterverzeichnis - Teil 4-4: Materialien - Materialien fuer Oberflaechen-(OFW-)Bauelemente (IEC/TS 61994-4-4:2010)
Dieser Teil von IEC 61994 legt Begriffe für Einkristall-Wafer, die für dem neuesten Stand der Technik entsprechende Oberflächenwellenbauelemente (engl.: surface acoustic wave – SAW) verwendet werden,...

References

This document references:
ISO 4287 FRENCH - Spécification géométrique des produits (GPS) - État de surface: Méthode du profil - Termes, définitions et paramètres d'état de surface AMENDEMENT 1: Nombre de pics
Published by ISO on June 15, 2009
A description is not available for this item.
This document references:
ISO 4287 - Geometrical Product Specifications (GPS) - Surface Texture: Profile Method - Terms, Definitions and Surface Texture Parameters
Published by ISO on April 1, 1997
This International Standard specifies terms, definitions and parameters for the determination of surface texture (roughness, waviness and primary profile) by profiling methods.
This document references:
IEC 62276 - Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
Published by IEC on October 1, 2016
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
This document references:
IEC 60050-561 - AMENDMENT 1 International electrotechnical vocabulary – Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
Published by IEC on December 1, 2016
A description is not available for this item.
This document references:
IEC TS 61994-4-1 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
Published by IEC on November 1, 2018
This part of IEC 61994 gives the terms and definition for synthetic quartz crystals representing the state of the art, which are intended for manufacturing piezoelectric and optical elements
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