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DOD - SMD 5962-16208

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, LOW POWER REPROGRAMMABLE 151,824 LOGIC ELEMENT FLASH FIELD PROGRAMMABLE GATE ARRAY WITH DECOUPLING CAPACITORS, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 1 November 2019
Status: active
Page Count: 69
scope:

Scope.

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-16208
November 1, 2019
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, LOW POWER REPROGRAMMABLE 151,824 LOGIC ELEMENT FLASH FIELD PROGRAMMABLE GATE ARRAY WITH DECOUPLING CAPACITORS, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
June 15, 2018
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, LOW POWER REPROGRAMMABLE 151,824 LOGIC ELEMENT FLASH FIELD PROGRAMMABLE GATE ARRAY WITH DECOUPLING CAPACITORS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
April 16, 2018
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, LOW POWER REPROGRAMMABLE 151,824 LOGIC ELEMENT FLASH FIELD PROGRAMMABLE GATE ARRAY WITH DECOUPLING CAPACITORS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
March 5, 2018
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, LOW POWER REPROGRAMMABLE 151,824 LOGIC ELEMENT FLASH FIELD PROGRAMMABLE GATE ARRAY WITH DECOUPLING CAPACITORS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...

References

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