IEEE C62.59
Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
active, Most Current
Buy Now
| Organization: | IEEE |
| Publication Date: | 5 September 2019 |
| Status: | active |
| Page Count: | 41 |
scope:
This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems.
The technology types covered are:
- Forward biased diodes
- Zener breakdown diodes
- Avalanche breakdown diodes
- Punch-through diodes
- Foldback diodes
This standard does not cover thyristor surge protective components; see IEEE Std C62.37 [B18].1
1The numbers in brackets correspond to those of the bibliography in Annex A.
Document History
IEEE C62.59
September 5, 2019
Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in...