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IEEE C62.59

Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

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Organization: IEEE
Publication Date: 5 September 2019
Status: active
Page Count: 41
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This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems.

The technology types covered are:

- Forward biased diodes

- Zener breakdown diodes

- Avalanche breakdown diodes

- Punch-through diodes

- Foldback diodes

This standard does not cover thyristor surge protective components; see IEEE Std C62.37 [B18].1

1The numbers in brackets correspond to those of the bibliography in Annex A.

Document History

IEEE C62.59
September 5, 2019
Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in...

References

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