IEC TS 62804-1-1
Photovoltaic (PV) modules – Test methods for the detection of potential-induced degradation – Part 1-1: Crystalline silicon – Delamination
|Publication Date:||1 January 2020|
|ICS Code (Solar energy engineering):||27.160|
This part of IEC 62804 defines procedures to test and evaluate for potential-induced degradation-delamina
Modules are tested in a climactic chamber with damp heat and application of module-rated system voltage to the cell circuit in each polarity that is specified or allowed in the module documentation. This document does not differentiate the effects of some construction methods of mitigating PID-for example, the use of rear rail mounts, edge clips, and insulating frames that may serve to electrically isolate the module faces to varying extents. The actual durability of modules to system voltage stress will depend on the mounting design and the environmental conditions under which the modules are operated. These tests are intended to assess the sensitivity of the PV module laminate to PID-d irrespective of actual stresses under operation in different climates and systems.