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ISO DIS 9220

Metallic coatings — Measurement of coating thickness — Scanning electron microscope method

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Organization: ISO
Publication Date: 24 March 2021
Status: active
Page Count: 16
ICS Code (Metallic coatings): 25.220.40
scope:

This document specifies a destructive method for the measurement of the local thickness of metallic coatings (hereafter also other inorganic coatings are meant) by examination of cross-sections with a scanning electron microscope (SEM). The method can be used for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (ISO 1463) when applicable. The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10).

Document History

ISO DIS 9220
March 24, 2021
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
This document specifies a destructive method for the measurement of the local thickness of metallic coatings (hereafter also other inorganic coatings are meant) by examination of cross-sections with...
January 1, 1988
Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (CEN EN ISO 9220: 1994)
A description is not available for this item.

References

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