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BSI - BS EN IEC 60444-6 - TC

Tracked Changes (Redline) - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

active, Most Current
Organization: BSI
Publication Date: 18 May 2022
Status: active
Page Count: 62
ICS Code (Piezoelectric devices): 31.140

Document History

BS EN IEC 60444-6 - TC
May 18, 2022
Tracked Changes (Redline) - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
A description is not available for this item.

References

This document references:
EN 60444-1 - Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network
Published by CENELEC on April 1, 1997
A description is not available for this item.
This document references:
EN 60444-5 - Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
Published by CENELEC on April 1, 1997
A description is not available for this item.
This document references:
EN 60444-8 - Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
Published by CENELEC on April 1, 2017
This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of...
This document references:
IEC 60122-2-1 - Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection - Section One: Quartz Crystal Units for Microprocessor Clock Supply
Published by IEC on August 1, 1993
A description is not available for this item.
This document references:
IEC 60444-1 - Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network
Published by IEC on January 1, 1986
A description is not available for this item.
This document references:
IEC 60444-5 - Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
Published by IEC on May 1, 1995
A description is not available for this item.
This document references:
IEC 60444-8 - Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface mounted quartz crystal units
Published by IEC on December 1, 2016
This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of...
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