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IEC - TS 62788-6-3

Measurement procedures for materials used in photovoltaic modules – Part 6-3: Adhesion testing for PV module laminates using the single cantilevered beam (SCB) method

active, Most Current
Organization: IEC
Publication Date: 1 August 2022
Status: active
Page Count: 36
ICS Code (Solar energy engineering): 27.160
scope:

This part of IEC TS 62788 provides a method for measuring the adhesion energy of most interfaces within the photovoltaic (PV) module laminate.

In contrast to other adhesion tests in general use, this method provides a measure of adhesive energy, via the critical energy release rate, and so is more useful for comparing adhesion of different specimen types; e.g. different materials, module or coupon samples, or materials before and after stress exposure.

This is a "weakest link" test, meaning that the weakest interface is the one most likely to fail in a given test. Adhesion of a specific layer may be difficult to intentionally measure if there is a weaker interface in the system.

Document History

TS 62788-6-3
August 1, 2022
Measurement procedures for materials used in photovoltaic modules – Part 6-3: Adhesion testing for PV module laminates using the single cantilevered beam (SCB) method
This part of IEC TS 62788 provides a method for measuring the adhesion energy of most interfaces within the photovoltaic (PV) module laminate. In contrast to other adhesion tests in general use,...

References

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