IEC - TS 62788-6-3
Measurement procedures for materials used in photovoltaic modules – Part 6-3: Adhesion testing for PV module laminates using the single cantilevered beam (SCB) method
| Organization: | IEC |
| Publication Date: | 1 August 2022 |
| Status: | active |
| Page Count: | 36 |
| ICS Code (Solar energy engineering): | 27.160 |
scope:
This part of IEC TS 62788 provides a method for measuring the adhesion energy of most interfaces within the photovoltaic (PV) module laminate.
In contrast to other adhesion tests in general use, this method provides a measure of adhesive energy, via the critical energy release rate, and so is more useful for comparing adhesion of different specimen types; e.g. different materials, module or coupon samples, or materials before and after stress exposure.
This is a "weakest link" test, meaning that the weakest interface is the one most likely to fail in a given test. Adhesion of a specific layer may be difficult to intentionally measure if there is a weaker interface in the system.
Document History