scope:

These test methods cover tests to determine transistor collector-emitter saturation voltage, V_CE(SAT), under specified conditions.

The d-c method is applicable at currents low enough to produce negligible heating in the junction.

The pulse method is applicable at high currents that would cause significant heating in the junction if not pulsed.

These test methods can be used to measure the collector-emitter voltage for given values of I_B and I_C (see 2.2.3 and 2.2.4) even if the transistor is not operating in the saturation region, if a voltage-measuring device having suitable range and input impedance is used to measure the collector-emitter voltage.

This standard does not purport to address the safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.