ECIA - EIA-364-102
TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
active, Most Current
| Organization: | ECIA |
| Publication Date: | 1 December 1998 |
| Status: | active |
| Page Count: | 17 |
scope:
This standard is applicable to electrical connectors, sockets, cable assemblies, or interconnection systems.
Document History
December 1, 1998
TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
This standard is applicable to electrical connectors, sockets, cable assemblies, or interconnection systems
EIA-364-102
December 1, 1998
TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
This standard is applicable to electrical connectors, sockets, cable assemblies, or interconnection systems.
December 1, 1998
TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
This standard is applicable to electrical connects, sockets, cable assemblies, or interconnection systems.
Object
This standard describes a methods for measuring the effect a speciment has on the...
December 1, 1998
TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
This standard is applicable to electrical connectors, sockets, cable assemblies, or interconnection systems.
December 1, 1998
TP-102 Rise Time Degradation Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
A description is not available for this item.