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BSI - PD CLC/TS 50659 - TC

Tracked Change (Redline) - Electromagnetic characteristics of linear cable management systems (CMS)

active, Most Current
Organization: BSI
Publication Date: 22 December 2023
Status: active
Page Count: 67
ICS Code (Conduits for electrical purposes): 29.120.10

Document History

PD CLC/TS 50659 - TC
December 22, 2023
Tracked Change (Redline) - Electromagnetic characteristics of linear cable management systems (CMS)
A description is not available for this item.

References

This document references:
EN 60060-1 - High-voltage test techniques - Part 1: General definitions and test requirements
Published by CENELEC on December 1, 2010
This part of IEC 60060 is applicable to: – dielectric tests with direct voltage; – dielectric tests with alternating voltage; – dielectric tests with impulse voltage; – dielectric tests with...
This document references:
EN 61000-4-5 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
Published by CENELEC on August 1, 2014
Scope and object This part of IEC 61000 relates to the immunity requirements, test methods, and range of recommended test levels for equipment with regard to unidirectional surges caused by...
This document references:
EN 61000-5-7 - Electromagnetic Compatibility (EMC) Part 5-7: Installation and Mitigation Guidelines - Degrees of Protection by Enclosures Against Electromagnetic Disturbances (EM Code)
Published by CENELEC on April 1, 2001
A description is not available for this item.
This document references:
EN 61537 - Cable management - Cable tray systems and cable ladder systems
Published by CENELEC on January 1, 2007
A description is not available for this item.
This document references:
IEC 60060-1 - High-voltage test techniques – Part 1: General definitions and test requirements
Published by IEC on September 1, 2010
This part of IEC 60060 is applicable to: – dielectric tests with direct voltage; – dielectric tests with alternating voltage; – dielectric tests with impulse voltage; – dielectric tests with...
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