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BSI - 13/30264600 DC

Draft BS EN 60747-14-8 ED 1.0 Semiconductor devices Part 14-8: Semiconductor sensors - Capacitive degradation sensor of liquid

pending, Most Current
Organization: BSI
Publication Date: 19 June 2013
Status: pending
Page Count: 12
ICS Code (Semiconductor devices in general): 31.080.01

Document History

13/30264600 DC
June 19, 2013
Draft BS EN 60747-14-8 ED 1.0 Semiconductor devices Part 14-8: Semiconductor sensors - Capacitive degradation sensor of liquid
A description is not available for this item.

References

This document references:
IEC 60068-2-1 - Environmental testing – Part 2-1: Tests – Test A: Cold
Published by IEC on March 1, 2007
Introduction General This publication deals with cold tests appliable both to non heat-dissipating and heat-disspating specimens. for no heat-disspating specimens, Tests Aa and Ab do not deviate...
This document references:
IEC 60068-2-81 - Environmental testing Part 2-81: Tests Test Ei: Shock Shock response spectrum synthesis
Published by IEC on July 1, 2003
This part of IEC 60068 specifies tests using a synthesized shock response spectrum (SRS). It is intended for general application to specimens when simulation of transient excitation of a complex...
This document references:
IEC 60721-2-1 - Classification of environmental conditions – Part 2-1: Environmental conditions appearing in nature – Temperature and humidity
Published by IEC on June 1, 2013
This part of IEC 60721 presents classifications of open-air climates in terms of temperature and humidity. It is intended to be used as part of the background material when selecting appropriate...
This document references:
IEC 60747-1 - Semiconductor devices – Part 1: General
Published by IEC on August 1, 2010
This part of IEC 60747 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A).
This document references:
IEC 60747-14-1 - Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors
Published by IEC on January 1, 2010
This part of IEC 60147-14 describes general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors....
This document references:
IEC 60749-1 - Semiconductor devices – Mechanical and climatic test methods – Part 1: General
Published by IEC on August 1, 2002
A description is not available for this item.
This document references:
IEC 60749-36 - Semiconductor devices Mechanical and climatic test methods Part 36: Acceleration, steady state
Published by IEC on February 1, 2003
A description is not available for this item.
This document references:
ISO/IEC GUIDE 2 - Standardization and Related Activities - General Vocabulary
Published by ISO on January 1, 2004
This Guide provides general terms and definitions concerning standardization and related activities. It is intended to contribute fundamentally towards mutual understanding amongst the members of ISO...
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